Systematic Errors in the Measurement of Emissivity Caused by Directional Effects

In the Optics InfoBase, by the American Institute of Physics' Optical Society of America:
Authors: Abraham Kribus, Irna Vishnevetsky, Eyal Rotenberg, and Dan Yakir

---

Applied Optics, Vol. 42, Issue 10, pp. 1839-1846
Keywords (OCIS):
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
Abstract
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances...  » View Full Text: PDF