The InfraRed Sea Surface Emissivity (IRSSE) model

From Paul van Delst's Work Page at The Cooperative Institute for Meteorological Satellite Studies of the University of Wisconsin - Madison Space Science and Engineering Center.
The InfraRed Sea Surface Emissivity (IRSSE) model was developed for use in the Global Data Assimilation System (GDAS) at NCEP/EMC. Previously, the GDAS used an IRSSE model based on Masuda et al (1988). The Masuda model doesn't account for the effect of enhanced emission due to reflection from the sea surface (only an issue for larger view angles) and the implementation was based on coarse spectral resolution emissivity data making its application to high resolution instruments, such as AIRS, problematic.

The old IRSSE model has been upgraded to use sea surface emissivities derived via the Wu and Smith (1997) methodology as described in van Delst and Wu (2000). The emissivity spectra are computed assuming the infrared sensors are not polarised and using the data of Hale and Querry (1973) for the refractive index of water, Segelstein (1981) for the extinction coefficient, and Friedman (1969) for the salinitiy/chlorinity corrections.

Traceable emissivity measurements in RTP using room temperature reflectometry

By: Hunter, A.; Adams, B.; Ramanujam, R.
Advanced Thermal Processing of Semiconductors, 2003. RTP 2003. 11th IEEE International Conference on RTP
Volume , Issue , 23-26 Sept. 2003 Page(s): 85 - 88
Digital Object Identifier 10.1109/RTP.2003.1249127
Summary:

The design of an integrating reflectometer specific to the optical and spectral requirements of rapid thermal processing (RTP) is discussed. We report reflectance measurements of various materials. These measurements are correlated to in-situ emittance measurements recorded during rapid thermal processing. We also present the design of an optimized emissometer for an RTP chamber. We propose a means for correlating room temperature reflectance measurements to emittance standards for RTP.

View citation and abstract

Real Time Emissivity Measurement For IR Temp Measurements

This online page at The Pyrometer Instrument Company website, discusses the emissivity correction techniques employed in their products, the very narrow waveband devices called the Pyrolaser® (Shown here), the Pyrofiber® & the Optitherm® III Emissivity Technology.

(Notes: 1. The article speaks about "emissivity" but the spectral emissivity is implied due to the fact that these devices operate in very narrow wavebands at 865nm, 905nm or 1550nm, according to the model.
2. The article also provides a calculation and describes the radiant power of the laser as "energy".)

Here's an edited quote from the page:
"The emissivity is measured by firing a pulsed laser of monitored output energy to the target and measuring the reflected laser energy. Assuming that no energy is transmitted through the target (opaque material) the impinging energy must either be absorbed or reflected.

"The unknown absorbed energy can be calculated from the two measured quantities outgoing energy and reflected energy.

"Since absorptivity and emissivity are equal...the target emissivity (e) is known as soon as the absorptivity is known.

The temperature is measured by collecting the radiance in a narrow band (10-50nm) at the same wavelength (865nm, 905nm or 1550nm depending on the specific instrument) where emissivity is measured with the laser."