Polarized spectral emittance from periodic micromachined surfaces. I. Doped silicon: The normal direction

Peter J. Hesketh, Jay N. Zemel & Benjamin Gebhart ; Physical Review B.37.10795
VOLUME 37, NUMBER 18 1988

From the Abstract: The normal, polarized spectral (3 um <=lambda =>14um) emittances of highly doped, micromachined, periodic structures on heavily phosphorus-doped (110) silicon ([P]?5×10¹⁹cm^-3) were measured for .....